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Англо-русский словарь строительных терминов > device under test
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English-German dictionary of Electrical Engineering and Electronics > device under test
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тестируемое устройство
(МСЭ-Т G.991.2).
[ http://www.iks-media.ru/glossary/index.html?glossid=2400324]Тематики
- электросвязь, основные понятия
EN
Англо-русский словарь нормативно-технической терминологии > device under test
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English-Russian dictionary of Information technology > device under test
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1) Техника: испытуемый прибор, прибор под контролем, тестируемое устройство2) Строительство: испытываемое устройство3) Вычислительная техника: проверяемое устройство4) Метрология: испытываемый прибор, поверяемый прибор, тестируемый/поверяемый прибор5) Автоматика: объект технического диагностирования6) Контроль качества: испытуемое устройство, проверяемый прибор -
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= DUT -
10 device under test
• testattava laite• testilaite -
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przyrząd testowany -
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Англо-русский словарь компьютерных и интернет терминов > device under test
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English-Russian dictionary of terms that are used in computer games > device under test
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испытываемое устройство; проверяемое устройство; тестируемое устройство -
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объект испытаний [диагностирования] -
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проверяемый или испытываемый приборThe English-Russian dictionary on reliability and quality control > device under test
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20 DUT Device Under Test
См. также в других словарях:
Device under test — (DUT), also known as unit under test (UUT), is a term commonly used to refer to a manufactured product undergoing testing. In semiconductor testing In semiconductor testing, DUT refers to a specific die on a wafer or the resulting packaged part.… … Wikipedia
Device Under Test — Als Device Under Test (dt.: Prüfling), kurz DUT, wird vor allem in der elektrischen Mess und Prüftechnik das zu prüfende Objekt bezeichnet. Dies kann ein einzelnes Bauteil, eine Baugruppe oder ein komplettes Gerät sein. Welche Funktionen des DUT… … Deutsch Wikipedia
System Under Test — (shortened as SUT) refers to a system that is being tested for correct operation. The term is used mostly in software testing.A special case of a software system is an application which, when tested, is called an Application Under Test.The term… … Wikipedia
Test probe — Typical passive oscilloscope probe being used for testing an integrated circuit. A test probe (test lead, test prod, or scope probe) is a physical device used to connect electronic test equipment to the device under test (DUT). They range from… … Wikipedia
Test bench — A test bench is a virtual environment used to verify the correctness or soundness of a design or model (e.g., a software product).The term has its roots in the testing of electronic devices, where an engineer would sit at a lab bench with tools… … Wikipedia
Test engineer — A (hardware) test engineer (TE) is a professional who determines how to create a process that would test a particular product in manufacturing, or related area like RMA department, in order to guarantee that the product will be shipped out with… … Wikipedia
Test light — Neon test lamp for line voltages A test light, test lamp, voltage tester, or mains tester is a very simple piece of electronic test equipment used to determine the presence or absence of an electric voltage in a piece of equipment under test.… … Wikipedia
test — {{Roman}}I.{{/Roman}} noun 1 examination of sb s knowledge/ability ADJECTIVE ▪ demanding, difficult, gruelling/grueling ▪ easy, simple ▪ fair, good … Collocations dictionary
Test and tagging — is a generic name given to the process of visually inspecting and electrically testing in service electrical equipment for personal use and/or safety. Colloquially, it is also referred to as; tagging, test tag, test and tag, electrical tagging,… … Wikipedia
In-circuit test — (ICT) is an example of white box testing where an electrical probe tests a populated printed circuit board (PCB), checking for shorts, opens, resistance, capacitance, and other basic quantities which will show whether the assembly was correctly… … Wikipedia
Multi-site test — Multi site test, or multisite test , or concurrent test , or parallel test are all semiconductor Automatic Test Equipment (ATE) terms that generally refer to testing of multiple devices at the same time. Currently, devices refer to System on a… … Wikipedia